回转式空气预热器流场仿真分析

为分析某电厂1000 MW锅炉机组的双密封回转式空气预热器漏风问题,建立局部流体仿真模型。通过理论计算和仿真模拟相结合的方法分析了密封间隙对回转式空气预热器内部流场压力分布、密封压差及漏风率的影响,并针对“三密封”特殊时刻下的流场压力及漏风率变化做了研究。结果表明,密封间隙从2 mm到8 mm的变化过程中,密封片受到的最大压差小于7000 Pa;为使空预器漏风率小于5%,其漏风间隙需要控制在3 mm以内;“三密封”时刻下的漏风率达到了最小值,为3.98%。经过分析总结,为密封片的载荷计算及密封片的改进提供一定的参考。     

基于双应力加速寿命试验的关节轴承寿命预测与可靠性分析

自润滑关节轴承寿命主要是由衬垫的磨损性能决定的,但衬垫的磨损一般是非线性的,使得寿命难以预测。采用同时改变载荷和摆频2种应力的方法进行加速寿命试验,建立以pv值、磨损量退化数据为输入参数,寿命值为输出参数的灰色神经网络预测模型。经验证该预测模型对关节轴承寿命预测的最大误差仅为7.33%,平均误差仅为3.892%。对不同加速应力下自润滑关节轴承可靠性进行评估,结果表明,关节轴承的可靠性在L_(10)(可靠度为90%时的寿命)之前下降趋势缓慢,然后迅速下降,pv值越大可靠性下降越迅速;随着pv值的增大,关节轴承寿命近似呈指数下降,经验证可用逆幂率加速模型反映二者关系。     

破损水文观测孔涌水封堵技术在高河矿的应用

针对高河矿奥灰水文观测孔空水管锈蚀断裂漏水严重的问题,分析了存在的问题,制定了钻孔涌水封堵技术方案及相应的注浆施工工艺,并进行了为期7天的井下试验。封堵注浆压力达到6 MPa,使用注浆水泥50 t,水泥浆液凝固良好,注浆阀门打开后无出水现象。     

Precise Extraction of Charge Carrier Mobility for Organic Transistors

Unreliable mobility values, and particularly greatly overestimated values and severely distorted temperature dependences, have recently hampered the development of the organic transistor field. Given that organic field‐effect transistors (OFETs) have been routinely used to evaluate mobility, precise parameter extraction using the electrical properties of OFETs is thus of primary importance. This review examines the origins of the various mobilities that must be determined for OFET applications, the relevant extraction methods, and the data selection limitations, which help in avoiding conceptual errors during mobility extraction. For increased precision, the review also discusses device fabrication considerations, calibration of both the specific gate‐dielectric capacitance and the threshold voltage, the contact effects, and the bias and temperature dependences, which must actually be handled with great care but have mostly been overlooked to date. This review serves as a systematic overview of the OFET mobility extraction process to ensure high precision and will also aid in improving future research.     

基于离心机的低气压精密控制研究

针对惯性器件全量程气压灵敏度校准难题,发明了一种可抗高离心加速度的气压箱结构,并研制了离心-气压复合校准装置,实现了大g值条件下惯性器件气压特性的校准。本装置设计了两种工作模式:离心机静止时,利用真空泵、高精度压力传感器等气压精密测控系统实现离心-气压复合校准装置的精密控压;离心机工作时,通过密封技术等实现离心-气压复合校准装置保压。本装置通过对安装在离心机上的试验箱内气压进行精密控制,将高线加速度与气压环境有机结合在一起,为加速度计提供可靠的加速度、气压复合计量校准环境。实验结果验证了所设计的气压箱结构可以实现气压范围1~100 kPa,气压偏差优于10 Pa的精密控制。     

空压机润滑油系统可靠性试验研究

对空压机润滑系统进行分析,提出了一种润滑油压力调节机构,保证了空压机在高油温时油压正常,为空压机运动件提供充分润滑,从而提高空压机运行的可靠性。实验证明了该机构是可靠的,为空压机润滑系统设计提供了参考依据。     

40 years FORM: Some new aspects?

40 years ago Hasofer and Lind wrote their seminal paper [13] about FORM where they described an algorithm for finding the beta point. This algorithm, later in 1978 generalized by Rackwitz and Fiessler in [23] to include nonnormal random variables, is known as Hasofer-Lind–Rackwitz-Fiessler (HL–RF) algorithm and till now it is an important tool for reliability calculations. Here its relation with standard numerical optimization is explained. Further a simple method for computing the SORM factor is given and the connection of FORM/SORM with dimension reduction concepts is outlined.     

Reliability of complex chemical engineering processes

This paper presents a stochastic performance modelling approach that can be used to optimise design and operational reliability of complex chemical engineering processes. The framework can be applied to processes comprising multiple units, including the cases where closed form process performance functions are unavailable or difficult to derive from first principles, which is often the case in practice. An interface that facilitates automated two-way communication between Matlab^® and process simulation environment is used to generate large process responses. The resulting constrained optimisation problem is solved using both Monte Carlo Simulation (MCS) and First Order Reliability Method (FORM); providing a wide range of stochastic process performance measures. Adding such capabilities to traditional deterministic process simulators provides a more informed basis for selecting optimum design factors; giving a simple way of enhancing overall process reliability and cost-efficiency. Two case study systems are considered to highlight the applicability and benefits of the approach.     

Availability growth models and verification of power equipment

The general availability growth models for large scale complicated repairable system such as electric generating units, power station auxiliaries, and transmission and distribution installations are presented. The calculation formulas for the maintenance coefficient, mathematical expressions for general availability growth models, ways for estimating, and fitting on checking the parameters of the model are introduced. Availability growth models for electric generating units, power station auxiliaries, and transmission and distribution installations are given together with verification examples for availability growth models of 320–1000 MW nuclear power units and 1000 MW thermal power units, 200–1000 MW power station auxiliaries, and 220–500 kV transmission and distribution installations. The verification results for operation availability data show that the maintenance coefficients for electric generating units, power station auxiliaries, transmission and distribution installations conform to the power function, and general availability growth models conform to rules of availability growth tendency of power equipment.     

Development of silicon wafer packaging technology for deep UV LED

This paper reports a deep‐ultraviolet LED (deep‐UV‐LED) package based on silicon MEMS process technology (Si‐PKG). The package consists of a cavity formed by silicon crystalline anisotropic etching, through‐silicon vias (TSVs) filled with electroplated Cu, bonding metals made of electroplated Ni/AuSn and a quartz lid for hermetic sealing. A deep‐UV LED die is directly mounted in the Si‐PKG by AuSn eutectic bonding without a submount. It has advantages in terms of size, heat dissipation, light utilization efficiency, productivity and cost over conventional AlN ceramic packages. We confirmed a light output of 30 mW and effective reflection on Si (111) cavity slopes in the Si‐PKG. Based on simulation, further improvement of the optical output is expected by optimizing DUV‐LED die mount condition.